发明申请
US20080111573A1 Pin-Type Probes for Contacting Electronic Circuits and Methods for Making Such Probes
审中-公开
用于接触电子电路的引脚型探针和制造这种探针的方法
- 专利标题： Pin-Type Probes for Contacting Electronic Circuits and Methods for Making Such Probes
- 专利标题（中）： 用于接触电子电路的引脚型探针和制造这种探针的方法
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申请号： US11929487申请日： 2007-10-30
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公开(公告)号： US20080111573A1公开(公告)日： 2008-05-15
- 发明人: Richard T. Chen , Ezekiel J.J. Kruglick , Vacit Arat , Daniel I. Feinberg
- 申请人： Richard T. Chen , Ezekiel J.J. Kruglick , Vacit Arat , Daniel I. Feinberg
- 专利权人： Microfabrica Inc.
- 当前专利权人： Microfabrica Inc.
- 主分类号： G01R1/067
- IPC分类号： G01R1/067 ; G01R31/02
摘要：
Pin probes and pin probe arrays are provided that allow electric contact to be made with selected electronic circuit components. Some embodiments include one or more compliant pin elements located within a sheath. Some embodiments include pin probes that include locking or latching elements that may be used to fix pin portions of probes into sheaths. Some embodiments provide for fabrication of probes using multi-layer electrochemical fabrication methods.
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