发明申请
- 专利标题: Phase locked loops capable of burn-in testing with increased locking range and burn-in testing method thereof
- 专利标题(中): 锁相环能够通过增加锁定范围和老化测试方法进行老化测试
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申请号: US11822216申请日: 2007-07-03
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公开(公告)号: US20080112524A1公开(公告)日: 2008-05-15
- 发明人: Soo-Jin Paek , Jae-wook Lee , Ho-keun Cho
- 申请人: Soo-Jin Paek , Jae-wook Lee , Ho-keun Cho
- 专利权人: SAMSUNG ELECTRONICS CO., LTD
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD
- 优先权: KR10-2006-0113036 20061115
- 主分类号: H03D3/24
- IPC分类号: H03D3/24
摘要:
In phase locked loop, a phase detector detects a phase difference between a first clock signal and a second clock signal and output a first output signal based on the detected difference. A charge pump generates a control voltage in response to the first output signal from the phase detector. A voltage-controlled oscillator generates the second clock signal. A controller controls the control voltage such that the phase difference between the first clock signal and the second clock signal is increased in response to a burn-in test mode signal.
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