发明申请
US20080112524A1 Phase locked loops capable of burn-in testing with increased locking range and burn-in testing method thereof 失效
锁相环能够通过增加锁定范围和老化测试方法进行老化测试

Phase locked loops capable of burn-in testing with increased locking range and burn-in testing method thereof
摘要:
In phase locked loop, a phase detector detects a phase difference between a first clock signal and a second clock signal and output a first output signal based on the detected difference. A charge pump generates a control voltage in response to the first output signal from the phase detector. A voltage-controlled oscillator generates the second clock signal. A controller controls the control voltage such that the phase difference between the first clock signal and the second clock signal is increased in response to a burn-in test mode signal.
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