发明申请
US20080115029A1 ITERATIVE TEST GENERATION AND DIAGNOSTIC METHOD BASED ON MODELED AND UNMODELED FAULTS
审中-公开
基于建模和未修正故障的迭代测试和诊断方法
- 专利标题: ITERATIVE TEST GENERATION AND DIAGNOSTIC METHOD BASED ON MODELED AND UNMODELED FAULTS
- 专利标题(中): 基于建模和未修正故障的迭代测试和诊断方法
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申请号: US11552567申请日: 2006-10-25
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公开(公告)号: US20080115029A1公开(公告)日: 2008-05-15
- 发明人: Mary P. Kusko , Thomas J. Fleischman , Franco Motika , Phong T. Tran
- 申请人: Mary P. Kusko , Thomas J. Fleischman , Franco Motika , Phong T. Tran
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 主分类号: G01R31/28
- IPC分类号: G01R31/28 ; G06F11/00
摘要:
A diagnostic and characterization tool applicable to structural VLSI designs to address problems associated with fault tester interactive pattern generation and ways of effectively reducing diagnostic test time while achieving greater fail resolution. Empirical fail data drives the creation of adaptive test patterns which localize the fail to a precise location. This process iterates until the necessary localization is achieved. Both fail signatures and associated callouts as well as fail signatures and adaptive patterns are stored in a library to speed diagnostic resolution. The parallel tester application and adaptive test generation provide an efficient use of resources while reducing overall test and diagnostic time.