发明申请
US20080126863A1 Testing DRAM Chips with a PC Motherboard Attached to a Chip Handler by a Solder-Side Adaptor Board with an Advanced-Memory Buffer (AMB) 有权
用具有高级内存缓冲区(AMB)的焊接侧适配器板连接到芯片处理器的PC主板测试DRAM芯片

Testing DRAM Chips with a PC Motherboard Attached to a Chip Handler by a Solder-Side Adaptor Board with an Advanced-Memory Buffer (AMB)
摘要:
Memory chips are tested by insertion into a chip test socket on a test adapter board that is mounted to the reverse or solder-side of a personal computer motherboard. A memory module socket is removed from the motherboard, and adapter pins are inserted into holes for the removed memory module socket, but from the reverse (solder) side of the motherboard. The adapter pins connect to the test adapter board either directly, through a connector plug, or through an intervening adapter board. The test adapter board has soldered onto it additional memory chips and buffer chips on a memory module, such as an Advanced Memory Buffer (AMB) for a fully-buffered memory module. The built-in-self-test (BIST) feature of the AMB may be used to test the memory chip under test in the chip test socket, or the processor on the motherboard may write and read the memory chip.
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