发明申请
- 专利标题: Optical-Scanning Microscope Examination Apparatus
- 专利标题(中): 光学扫描显微镜检查仪器
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申请号: US11628762申请日: 2005-06-09
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公开(公告)号: US20080130103A1公开(公告)日: 2008-06-05
- 发明人: Mitsuhiro Hara , Hiroshi Tosaka , Akihiro Horii , Yoshihisa Tanikawa
- 申请人: Mitsuhiro Hara , Hiroshi Tosaka , Akihiro Horii , Yoshihisa Tanikawa
- 申请人地址: JP Tokyo
- 专利权人: Olympus Corporation
- 当前专利权人: Olympus Corporation
- 当前专利权人地址: JP Tokyo
- 优先权: JP2004-175520 20040614; JP2004-214573 20040722
- 国际申请: PCT/JP05/10596 WO 20050609
- 主分类号: G02B21/06
- IPC分类号: G02B21/06
摘要:
A clear image having suppressed blurring due to pulsing is obtained by in-vivo examination of biological tissue or various internal organs of mammals, including small laboratory animals. The invention provides an optical-scanning microscope examination apparatus including a light source; a light-transmitting member for transmitting light from the light source; a collimator optical system for converting the transmitted light to a collimated beam; a beam-scanning unit for scanning the collimated beam on a subject; a focusing optical system for focusing the scanned beam onto the subject; a pupil-projection optical system; a light detector for detecting return light returning from the subject via the focusing optical system, the pupil-projection optical system, the beam-scanning unit, the collimator optical system, and the light-transmitting member; an actuator for moving the collimator optical system in an optical-axis direction; a control apparatus for controlling driving thereof; and a deflecting mechanism for deflecting the light issuing from the light-transmitting member in a direction intersecting the optical axis thereof, wherein the actuator is disposed in a space parallel to a plane including optical axes before and after deflection by the deflecting mechanism.
公开/授权文献
- US07852551B2 Optical-scanning microscope examination apparatus 公开/授权日:2010-12-14
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