发明申请
US20080142476A1 MULTI-STEP PHOTOMASK ETCHING WITH CHLORINE FOR UNIFORMITY CONTROL
有权
多级光电子蚀刻用氯乙烯进行均匀控制
- 专利标题: MULTI-STEP PHOTOMASK ETCHING WITH CHLORINE FOR UNIFORMITY CONTROL
- 专利标题(中): 多级光电子蚀刻用氯乙烯进行均匀控制
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申请号: US11612036申请日: 2006-12-18
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公开(公告)号: US20080142476A1公开(公告)日: 2008-06-19
- 发明人: RENEE KOCH , Scott A. Anderson
- 申请人: RENEE KOCH , Scott A. Anderson
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 主分类号: C23F1/00
- IPC分类号: C23F1/00
摘要:
Methods for etching quartz are provided herein. In one embodiment, a method of etching quartz includes providing a film stack on a substrate support disposed in a processing chamber, the film stack having a quartz layer partially exposed through a patterned layer; and etching the quartz layer of the film stack in a multi-step process including a first step of etching the quartz layer utilizing a first process gas comprising at least one fluorocarbon process gas and a chlorine-containing process gas; and a second step of etching the quartz layer utilizing a second process gas comprising at least one fluorocarbon process gas.
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