发明申请
- 专利标题: Thin film transistor, thin film transistor substate, and method of manufacturing the same
- 专利标题(中): 薄膜晶体管,薄膜晶体管子状态及其制造方法
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申请号: US12001031申请日: 2007-12-06
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公开(公告)号: US20080142797A1公开(公告)日: 2008-06-19
- 发明人: Eun-Guk Lee , Do-Hyun Kim , Chang-Oh Jeong , Je-Hun Lee , Soon-Kwon Lim
- 申请人: Eun-Guk Lee , Do-Hyun Kim , Chang-Oh Jeong , Je-Hun Lee , Soon-Kwon Lim
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 优先权: KR10-2006-0127671 20061214
- 主分类号: H01L29/22
- IPC分类号: H01L29/22 ; H01L21/84
摘要:
A thin film transistor substrate and a method of manufacturing the same are disclosed. The method of manufacturing a thin film transistor substrate includes forming a first conductive pattern group including a gate line, a gate electrode, and a lower gate pad electrode on a substrate, forming a gate insulating layer on the substrate on which the first conductive pattern group is formed, forming an oxide semiconductor pattern overlapping the gate electrode on the gate insulating layer, and forming first and second conductive layers on the substrate on which the oxide semiconductor pattern is formed and patterning the first and second conductive layers to form a second conductive pattern group including a data line, a source electrode, a drain electrode, and a data pad.
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