发明申请
- 专利标题: CHARGED PARTICLE BEAM DEVICE PROBE OPERATION
- 专利标题(中): 充电颗粒光束装置探测操作
-
申请号: US11957835申请日: 2007-12-17
-
公开(公告)号: US20080150557A1公开(公告)日: 2008-06-26
- 发明人: Christof BAUR , Robert J. FOLARON , Adam HARTMAN , Philip C. FOSTER , Jay C. NELSON , Richard E. STALLCUP
- 申请人: Christof BAUR , Robert J. FOLARON , Adam HARTMAN , Philip C. FOSTER , Jay C. NELSON , Richard E. STALLCUP
- 申请人地址: US TX Richardson
- 专利权人: ZYVEX INSTRUMENTS, LLC
- 当前专利权人: ZYVEX INSTRUMENTS, LLC
- 当前专利权人地址: US TX Richardson
- 主分类号: G01R31/305
- IPC分类号: G01R31/305
摘要:
An apparatus including a positioner control device, a measuring device and a control routine. The positioner control device is communicatively coupled to a chamber of a charged particle beam device (CPBD) and is configured to individually manipulate each of a plurality of probes within the CPBD chamber to establish contact between ones of the plurality of probes and corresponding ones of a plurality of contact points of a sample positioned in the CPBD chamber. The measuring device is communicatively coupled to the CPBD and the positioner control device and is configured to perform one of a measurement and a detection of a characteristic associated with one of the plurality of contact points. The control routine is configured to at least partially automate control of at least one of the CPBD, the positioner control device and the measuring device.
公开/授权文献
- US07675300B2 Charged particle beam device probe operation 公开/授权日:2010-03-09
信息查询