CHARGED PARTICLE BEAM DEVICE PROBE OPERATION
    4.
    发明申请
    CHARGED PARTICLE BEAM DEVICE PROBE OPERATION 有权
    充电颗粒光束装置探测操作

    公开(公告)号:US20080150557A1

    公开(公告)日:2008-06-26

    申请号:US11957835

    申请日:2007-12-17

    IPC分类号: G01R31/305

    摘要: An apparatus including a positioner control device, a measuring device and a control routine. The positioner control device is communicatively coupled to a chamber of a charged particle beam device (CPBD) and is configured to individually manipulate each of a plurality of probes within the CPBD chamber to establish contact between ones of the plurality of probes and corresponding ones of a plurality of contact points of a sample positioned in the CPBD chamber. The measuring device is communicatively coupled to the CPBD and the positioner control device and is configured to perform one of a measurement and a detection of a characteristic associated with one of the plurality of contact points. The control routine is configured to at least partially automate control of at least one of the CPBD, the positioner control device and the measuring device.

    摘要翻译: 一种包括定位器控制装置,测量装置和控制程序的装置。 定位器控制装置通信地耦合到带电粒子束装置(CPBD)的腔室,并且被配置为单独地操作CPBD室内的多个探针中的每一个,以建立多个探针中的一个探针和 位于CPBD室中的样品的多个接触点。 测量装置通信地耦合到CPBD和定位器控制装置,并被配置为执行与多个接触点之一相关联的特性的测量和检测中的一个。 控制程序被配置为至少部分地自动化对CPBD,定位器控制装置和测量装置中的至少一个的控制。

    Nano-manipulation by gyration
    7.
    发明授权
    Nano-manipulation by gyration 失效
    通过回转的纳米操纵

    公开(公告)号:US06812460B1

    公开(公告)日:2004-11-02

    申请号:US10680339

    申请日:2003-10-07

    IPC分类号: H01J3726

    摘要: A method of nano-manipulation, including providing a nano-scale object movably positioned over a substrate and positioning a probe of a scanning probe microscope proximate the nano-scale object. The probe is then moved across the substrate along a gyrating path proximate the nano-scale object to reposition the nano-scale object.

    摘要翻译: 一种纳米操作的方法,包括提供可移动地定位在衬底上的纳米级物体,并将扫描探针显微镜的探针定位在纳米尺度物体附近。 然后将探针沿着靠近纳米尺度物体的旋转路径跨越衬底移动,以重新定位纳米尺度物体。