ENHANCED SAMPLE PROCESSING DEVICES, SYSTEMS AND METHODS

Invention Application

US20080152546A1 ENHANCED SAMPLE PROCESSING DEVICES, SYSTEMS AND METHODS 审中-公开

Title translation: 增强样品加工设备，系统和方法

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Patent Title: ENHANCED SAMPLE PROCESSING DEVICES, SYSTEMS AND METHODS
Patent Title (中): 增强样品加工设备，系统和方法
Application No.: US11962669

Application Date: 2007-12-21
Publication No.: US20080152546A1

Publication Date: 2008-06-26
Inventor: William Bedingham , Christopher R. Kokaisel , Peter D. Ludowise , Barry W. Robole
Applicant: William Bedingham , Christopher R. Kokaisel , Peter D. Ludowise , Barry W. Robole
Assignee: 3M Innovative Properties Company
Current Assignee: 3M Innovative Properties Company
Main IPC: B01L11/00
IPC: B01L11/00 ; F17D1/17 ; F16K17/36

ENHANCED SAMPLE PROCESSING DEVICES, SYSTEMS AND METHODS

Abstract:

Devices, systems, and methods for processing sample materials. The sample materials may be located in a plurality of process chambers in the device, which is rotated during heating of the sample materials.

Abstract(Chinese):

用于处理样品的设备，系统和方法。样品材料可以位于装置中的多个处理室中，其在样品材料的加热期间旋转。

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