发明申请
- 专利标题: Apparatus and method of measuring distance using structured light
- 专利标题(中): 使用结构光测量距离的装置和方法
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申请号: US11987116申请日: 2007-11-27
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公开(公告)号: US20080159595A1公开(公告)日: 2008-07-03
- 发明人: Dong-ryeol Park , Woo-yeon Jeong , Seok-won Bang , Hyoung-ki Lee
- 申请人: Dong-ryeol Park , Woo-yeon Jeong , Seok-won Bang , Hyoung-ki Lee
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2006-0133908 20061226
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
Provided are an apparatus and method of measuring a distance using structured light. The apparatus includes a binarization unit binarizing an image, an image identification unit identifying an image having connected pixels in the binarized image, a length ratio calculation unit obtaining the length ratio of the major axis of the image having the connected pixels to a minor axis perpendicular to the major axis, a pixel mean calculation unit obtaining the mean of pixel values of the image having the connected pixels, and an image extraction unit extracting an image formed by the light irradiated from the light source, from the images having connected pixels using the length ratio and the mean of the pixel values.
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