发明申请
- 专利标题: Temperature Control Device and Temparature Control Method
- 专利标题(中): 温度控制装置和温度控制方法
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申请号: US10568623申请日: 2004-08-18
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公开(公告)号: US20080164899A1公开(公告)日: 2008-07-10
- 发明人: Masakazu Ando , Hiroyuki Takahashi , Tsuyoshi Yamashita , Takashi Hashimoto
- 申请人: Masakazu Ando , Hiroyuki Takahashi , Tsuyoshi Yamashita , Takashi Hashimoto
- 优先权: JP2003-294615 20030818
- 国际申请: PCT/JP04/11843 WO 20040818
- 主分类号: G01R31/26
- IPC分类号: G01R31/26
摘要:
Pressing an electronic device (2) to be tested to contact terminals (132a and 132b) while bringing a heater (112) having equal or close temperature change characteristics to those of the electronic device to be tested by a test pattern, transmitting a test pattern to the electronic device to be tested in this state, and controlling a power consumption of a heater so that total power of a power consumption of the electronic device to be tested by the test pattern and a power consumption of the heater becomes a constant value.
公开/授权文献
- US07619427B2 Temperature control device and temperature control method 公开/授权日:2009-11-17
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