A method for performing an erase operation is disclosed in a non-volatile memory having a plurality of memory cells. At least one memory cell is programmed having a threshold voltage level in a first region before programming, and after programming the memory cell has a threshold voltage level in a second region, wherein the second region is higher in threshold voltage than the fist region. The erasing operation implements a programming of memory bits that can inject negative charge carriers or electrons into a memory cell instead of using the conventional technique of injecting hot holes into the memory cell. This can avoid room temperature drift and charge loss caused by hot hole injection.