发明申请
- 专利标题: Stacked contact with low aspect ratio
- 专利标题(中): 堆叠接触低纵横比
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申请号: US11706553申请日: 2007-02-13
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公开(公告)号: US20080191352A1公开(公告)日: 2008-08-14
- 发明人: Chen-Hua Yu , Chen-Nan Yeh , Chih-Hsiang Yao , Wen-Kai Wan , Jye-Yen Cheng
- 申请人: Chen-Hua Yu , Chen-Nan Yeh , Chih-Hsiang Yao , Wen-Kai Wan , Jye-Yen Cheng
- 主分类号: H01L23/52
- IPC分类号: H01L23/52
摘要:
An integrated circuit structure includes a semiconductor substrate; a metallization layer over the semiconductor substrate; a first dielectric layer between the semiconductor substrate and the metallization layer; a second dielectric layer between the semiconductor substrate and the metallization layer, wherein the second dielectric layer is over the first dielectric layer; and a contact plug with an upper portion substantially in the second dielectric layer and a lower portion substantially in the first dielectric layer. The contact plug is electrically connected to a metal line in the metallization layer. The contact plug is discontinuous at an interface between the upper portion and the lower portion.
公开/授权文献
- US07880303B2 Stacked contact with low aspect ratio 公开/授权日:2011-02-01
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