发明申请
- 专利标题: Methods of forming semiconductor devices
- 专利标题(中): 形成半导体器件的方法
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申请号: US12070220申请日: 2008-02-15
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公开(公告)号: US20080200007A1公开(公告)日: 2008-08-21
- 发明人: Jong-Heun Lim , Chang-Ki Hong , Bo-Un Yoon , Seong-Kyu Yun , Suk-Hun Choi , Sang-Yeob Han
- 申请人: Jong-Heun Lim , Chang-Ki Hong , Bo-Un Yoon , Seong-Kyu Yun , Suk-Hun Choi , Sang-Yeob Han
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2007-0016450 20070216
- 主分类号: H01L21/762
- IPC分类号: H01L21/762
摘要:
A method of forming a semiconductor device includes: forming a pattern having trenches on a semiconductor substrate; forming a semiconductor layer on the semiconductor device that fills the trenches; planarizing the semiconductor layer using a first planarization process without exposing the pattern; performing an epitaxy growth process on the first planarized semiconductor layer to form a crystalline semiconductor layer; and planarizing the crystalline semiconductor layer until the pattern is exposed to form a crystalline semiconductor pattern.
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