发明申请
US20080204692A1 MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS AND METHOD FOR PRODUCING MICROSTRUCTURED COMPONENTS 审中-公开
微结构投影曝光装置及其生产微结构元件的方法

  • 专利标题: MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS AND METHOD FOR PRODUCING MICROSTRUCTURED COMPONENTS
  • 专利标题(中): 微结构投影曝光装置及其生产微结构元件的方法
  • 申请号: US12054991
    申请日: 2008-03-25
  • 公开(公告)号: US20080204692A1
    公开(公告)日: 2008-08-28
  • 发明人: Toralf GrunerBernd Geh
  • 申请人: Toralf GrunerBernd Geh
  • 申请人地址: DE Oberkochen
  • 专利权人: CARL ZEISS SMT AG
  • 当前专利权人: CARL ZEISS SMT AG
  • 当前专利权人地址: DE Oberkochen
  • 优先权: DE102005053651.4 20051110
  • 主分类号: G03B27/72
  • IPC分类号: G03B27/72 G03B27/54
MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS AND METHOD FOR PRODUCING MICROSTRUCTURED COMPONENTS
摘要:
A method for producing microstructured components in a microlithographic projection exposure apparatus is disclosed. The method includes imaging a pattern of structures into an image plane of a projection objective. The dose distribution of projection light in the image plane can be influenced so that the image of a structure is at least essentially independent of the topography of structures which lie inside a region surrounding the structure.
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