发明申请
- 专利标题: FAILURE ANALYSIS SYSTEM AND METHOD USING THE SAME
- 专利标题(中): 故障分析系统和使用该方法的方法
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申请号: US11862484申请日: 2007-09-27
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公开(公告)号: US20080210015A1公开(公告)日: 2008-09-04
- 发明人: LEI LI , PING CHEN , ZHI CHENG , HU LI , DONG LI , YONG-ZHI TAO , LIN-SEN DONG
- 申请人: LEI LI , PING CHEN , ZHI CHENG , HU LI , DONG LI , YONG-ZHI TAO , LIN-SEN DONG
- 申请人地址: CN ShenZhen City VG Tortola
- 专利权人: SHENZHEN FUTAIHONG PRECISION INDUSTRY CO., LTD.,SUTECH TRADING LIMITED
- 当前专利权人: SHENZHEN FUTAIHONG PRECISION INDUSTRY CO., LTD.,SUTECH TRADING LIMITED
- 当前专利权人地址: CN ShenZhen City VG Tortola
- 优先权: CN200710073072.9 20070202
- 主分类号: G01B3/18
- IPC分类号: G01B3/18
摘要:
A failure analysis system (900) for printed circuit board (600) includes testing equipment (100) and a monitor (200). The testing equipment includes a base (120), a fixing body (180), a supporting arm (140) and a micrometer (160). The fixing body and the supporting arm are both firmly fixed on the base. The printed circuit board is fastened to the fixing body. The micrometer is slidingly attached to the supporting arm. The micrometer has a pin (1612) at one end thereof for resisting one end of the printed circuit board. The monitor electronically connects with the printed board for receiving signals from the printed circuit board. When the pin of the micrometer reaches a certain position, the signal transmitted to the monitor is broken.
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