Micrometer-based measuring system and method of using same
    2.
    发明授权
    Micrometer-based measuring system and method of using same 有权
    基于千分尺的测量系统及其使用方法

    公开(公告)号:US07779550B2

    公开(公告)日:2010-08-24

    申请号:US11945512

    申请日:2007-11-27

    IPC分类号: G01B5/20

    CPC分类号: G01B5/285 G01B3/22

    摘要: A measuring system (100) for flatness degree measurement includes a measuring instrument (10) and a processing device (20). The measuring instrument has a base (12), a guide column (14), a sliding member (16), a digital micrometer (18) and a holding member (19). The guide column is vertically attached to the base. The sliding member is moveably attached to the guide column. The digital micrometer is firmly fastened to the sliding member. The holding member is configured for fixing a workpiece (40) and has a reference-standard surface formed thereon. The processing device electronically connects with the digital micrometer. The processing device receives a plurality of measured values from the digital micrometer and displays a testing result after processing the measured values.

    摘要翻译: 用于平坦度测量的测量系统(100)包括测量仪器(10)和处理设备(20)。 测量仪器具有底座(12),导柱(14),滑动构件(16),数字测微器(18)和保持构件(19)。 引导柱垂直连接到基座。 滑动构件可移动地附接到导向柱。 数字测微计牢固地固定在滑动构件上。 保持构件用于固定工件(40)并具有形成在其上的基准标准表面。 处理装置与数字千分尺电子连接。 处理装置从数字千分尺接收多个测量值,并在处理测量值之后显示测试结果。

    Testing mechanism for casings
    3.
    发明授权
    Testing mechanism for casings 失效
    外壳测试机构

    公开(公告)号:US07663359B2

    公开(公告)日:2010-02-16

    申请号:US11682764

    申请日:2007-03-06

    IPC分类号: G01R31/28

    CPC分类号: G01B11/0691

    摘要: An exemplary testing mechanism (100) is used for testing for a sufficiency of a casing 90. The testing mechanism includes a framework (20) and a testing module (40). The framework includes a base board (21) and a pillar (26). One end of the pillar is mounted on the base board. The testing module includes a main board (42) and at least one testing pin (44). The main board is slidably mounted on the pillar. A bottom end of the testing pin is slidably mounted to the main board. A top end of the testing pin is positioned adjacent to the base board of the framework. The at least one testing pin is located in a position corresponding to at least one mounting hole of a sufficient casing.

    摘要翻译: 示例性的测试机构(100)用于测试套管90的充分性。测试机构包括框架(20)和测试模块(40)。 框架包括基板(21)和支柱(26)。 支柱的一端安装在基板上。 测试模块包括主板(42)和至少一个测试引脚(44)。 主板可滑动地安装在支柱上。 测试销的底端可滑动地安装在主板上。 测试销的顶端定位成与框架的基板相邻。 所述至少一个测试销位于对应于足够壳体的至少一个安装孔的位置。

    Device for determining dimension of a workpiece
    4.
    发明授权
    Device for determining dimension of a workpiece 失效
    用于确定工件尺寸的装置

    公开(公告)号:US07984561B2

    公开(公告)日:2011-07-26

    申请号:US12399224

    申请日:2009-03-06

    IPC分类号: G01B11/24

    CPC分类号: G01B11/24 Y10S33/21

    摘要: A device for determining dimensions of a workpiece includes a locating apparatus, a determining apparatus and a main processor. The locating apparatus includes a locating board supporting workpieces and defining at least one detecting aperture therethrough. The determining apparatus includes a detecting module, the detecting module includes at least one laser detector, each laser detector includes a laser emitter and a laser receiver respectively mounted on two opposite sides of the locating board. The main processor is connected to the locating apparatus and the determining apparatus, the laser emitter emits laser beams traveling through the detecting aperture and received by the laser receiver, and the main processor determines the dimension of the workpiece according to the dimension of parts on the laser receiver shielded by the workpiece.

    摘要翻译: 用于确定工件尺寸的装置包括定位装置,确定装置和主处理器。 定位装置包括支撑工件的定位板,并且限定穿过其中的至少一个检测孔。 确定装置包括检测模块,检测模块包括至少一个激光检测器,每个激光检测器包括分别安装在定位板的两个相对侧上的激光发射器和激光接收器。 主处理器连接到定位装置和确定装置,激光发射器发射穿过检测孔并由激光接收器接收的激光束,并且主处理器根据部件的尺寸确定工件的尺寸 激光接收器被工件屏蔽。

    DEVICE FOR DETERMINING DIMENSION OF A WORKPIECE
    5.
    发明申请
    DEVICE FOR DETERMINING DIMENSION OF A WORKPIECE 失效
    用于确定工件尺寸的装置

    公开(公告)号:US20090248354A1

    公开(公告)日:2009-10-01

    申请号:US12399224

    申请日:2009-03-06

    IPC分类号: G01B11/00 G06F15/00

    CPC分类号: G01B11/24 Y10S33/21

    摘要: A device for determining dimensions of a workpiece includes a locating apparatus, a determining apparatus and a main processor. The locating apparatus includes a locating board supporting workpieces and defining at least one detecting aperture therethrough. The determining apparatus includes a detecting module, the detecting module includes at least one laser detector, each laser detector includes a laser emitter and a laser receiver respectively mounted on two opposite sides of the locating board. The main processor is connected to the locating apparatus and the determining apparatus, the laser emitter emits laser beams traveling through the detecting aperture and received by the laser receiver, and the main processor determines the dimension of the workpiece according to the dimension of parts on the laser receiver shielded by the workpiece.

    摘要翻译: 用于确定工件尺寸的装置包括定位装置,确定装置和主处理器。 定位装置包括支撑工件的定位板,并且限定穿过其中的至少一个检测孔。 确定装置包括检测模块,检测模块包括至少一个激光检测器,每个激光检测器包括分别安装在定位板的两个相对侧上的激光发射器和激光接收器。 主处理器连接到定位装置和确定装置,激光发射器发射穿过检测孔并由激光接收器接收的激光束,并且主处理器根据部件的尺寸确定工件的尺寸 激光接收器被工件屏蔽。

    Failure analysis system for printed circuit board and method using the same
    6.
    发明授权
    Failure analysis system for printed circuit board and method using the same 失效
    印刷电路板故障分析系统及其使用方法

    公开(公告)号:US07543507B2

    公开(公告)日:2009-06-09

    申请号:US11862484

    申请日:2007-09-27

    IPC分类号: G01N3/20

    摘要: A failure analysis system (900) for printed circuit board (600) includes testing equipment (100) and a monitor (200). The testing equipment includes a base (120), a fixing body (180), a supporting arm (140) and a micrometer (160). The fixing body and the supporting arm are both firmly fixed on the base. The printed circuit board is fastened to the fixing body. The micrometer is slidingly attached to the supporting arm. The micrometer has a pin (1612) at one end thereof for resisting one end of the printed circuit board. The monitor electronically connects with the printed board for receiving signals from the printed circuit board. When the pin of the micrometer reaches a certain position, the signal transmitted to the monitor is broken.

    摘要翻译: 用于印刷电路板(600)的故障分析系统(900)包括测试设备(100)和监视器(200)。 测试设备包括基座(120),固定体(180),支撑臂(140)和千分尺(160)。 固定体和支撑臂都牢固地固定在基座上。 印刷电路板固定在固定体上。 测微计滑动地附接到支撑臂。 测微计在其一端具有用于抵抗印刷电路板的一端的销(1612)。 显示器与印刷电路板电连接,用于从印刷电路板接收信号。 当千分尺的引脚达到某个位置时,传输到监视器的信号被破坏。

    FLEXIBLE FIXING SYSTEM FOR PRODUCT TESTING
    7.
    发明申请
    FLEXIBLE FIXING SYSTEM FOR PRODUCT TESTING 有权
    柔性固定系统,用于产品测试

    公开(公告)号:US20080169595A1

    公开(公告)日:2008-07-17

    申请号:US11752908

    申请日:2007-05-23

    IPC分类号: B25B11/00

    摘要: A flexible/adjustable fixing system (100) for fixing a workpiece (40) includes an information management module (10), a plurality of driving devices (20), and a positioning device (30). The information management module receives and processes the position information of the workpiece. The driving devices electronically couple with the information management module. The positioning device includes a platform (31) and a plurality of positioning pins (32). One end of the workpiece is positioned in a certain area of the platform. Each respective pin is attached to a corresponding driving device. When the driving device receives an order/signal from the information management module, the positioning pin is selectably driven relative to (e.g., toward, away from) the workpiece by the driving device.

    摘要翻译: 一种用于固定工件(40)的柔性/可调节固定系统(100)包括信息管理模块(10),多个驱动装置(20)和定位装置(30)。 信息管理模块接收并处理工件的位置信息。 驱动装置与信息管理模块电子耦合。 定位装置包括平台(31)和多个定位销(32)。 工件的一端位于平台的某一区域。 每个相应的销连接到相应的驱动装置。 当驱动装置从信息管理模块接收到订单/信号时,通过驱动装置相对于(例如,朝向,远离)工件可选择地驱动定位销。

    TESTING DEVICES FOR MULTIHOLE WORKPIECE
    8.
    发明申请
    TESTING DEVICES FOR MULTIHOLE WORKPIECE 有权
    多工作的测试设备

    公开(公告)号:US20080168849A1

    公开(公告)日:2008-07-17

    申请号:US11926495

    申请日:2007-10-29

    IPC分类号: G01M19/00

    CPC分类号: B23Q15/22

    摘要: A testing device (100) configured for testing a multihole workpiece (10) with a plurality of holes (12), includes a detecting station (120) and an inspecting box (140). The detecting station positions a plurality of detecting pins (124) and a plurality of detecting apparatus (128). The detecting pins correspond to the holes of the multihole workpiece. The detecting apparatus respond for the multihole workpiece and sending detecting signals. The inspecting box receives the detecting signals from the detecting apparatus of the detecting station, and deals with and shows detecting results.

    摘要翻译: 一种被配置为用多个孔(12)测试多孔工件(10)的测试装置(100),包括检测站(120)和检查箱(140)。 检测站定位多个检测引脚(124)和多个检测装置(128)。 检测销对应于多孔工件的孔。 检测装置响应多孔工件并发送检测信号。 检查箱从检测站的检测装置接收检测信号,处理并显示检测结果。

    MICROMETER-BASED MEASURING SYSTEM AND METHOD OF USING SAME
    9.
    发明申请
    MICROMETER-BASED MEASURING SYSTEM AND METHOD OF USING SAME 有权
    基于微机的测量系统及其使用方法

    公开(公告)号:US20080155846A1

    公开(公告)日:2008-07-03

    申请号:US11945512

    申请日:2007-11-27

    IPC分类号: G01B5/20

    CPC分类号: G01B5/285 G01B3/22

    摘要: A measuring system (100) for flatness degree measurement includes a measuring instrument (10) and a processing device (20). The measuring instrument has a base (12), a guide column (14), a sliding member (16), a digital micrometer (18) and a holding member (19). The guide column is vertically attached to the base. The sliding member is moveably attached to the guide column. The digital micrometer is firmly fastened to the sliding member. The holding member is configured for fixing a workpiece (40) and has a reference-standard surface formed thereon. The processing device electronically connects with the digital micrometer. The processing device receives a plurality of measured values from the digital micrometer and displays a testing result after processing the measured values.

    摘要翻译: 用于平坦度测量的测量系统(100)包括测量仪器(10)和处理设备(20)。 测量仪器具有底座(12),导柱(14),滑动构件(16),数字测微器(18)和保持构件(19)。 引导柱垂直连接到基座。 滑动构件可移动地附接到导向柱。 数字测微计牢固地固定在滑动构件上。 保持构件用于固定工件(40)并具有形成在其上的基准标准表面。 处理装置与数字千分尺电子连接。 处理装置从数字千分尺接收多个测量值,并在处理测量值之后显示测试结果。

    Method for making an inspection fixture, and mold assembly used in the method
    10.
    发明授权
    Method for making an inspection fixture, and mold assembly used in the method 失效
    制造检验夹具的方法和在该方法中使用的模具组装

    公开(公告)号:US07950130B2

    公开(公告)日:2011-05-31

    申请号:US11610349

    申请日:2006-12-13

    IPC分类号: B23P25/00

    摘要: In a method for making an inspection fixture, a detachable mold assembly (20) and a hardenable fluid are firstly prepared. Secondly, the hardenable fluid is poured into the mold assembly, and a plurality of molding pins (23) are inserted into the mold assembly. Thirdly, a main body (21) with a plurality of positioning holes (2122) corresponding to the molding pins (i.e., the locations thereof) are formed in the mold after the hardenable fluid hardens. Fourthly, the mold assembly is detached, and the part is removed from the mold. Finally, a plurality of positioning pins is mounted into the positioning holes of the molded part, the positioning holes having remained upon removal of the molding pins.

    摘要翻译: 在制造检查夹具的方法中,首先准备可拆卸模具组件(20)和可硬化流体。 其次,将可硬化流体倒入模具组件中,并将多个模制销(23)插入模具组件中。 第三,在可硬化流体硬化之后,在模具中形成具有对应于成形销(即其位置)的多个定位孔(2122)的主体(21)。 第四,拆卸模具组件,并将模具从模具中取出。 最后,多个定位销安装在模制部件的定位孔中,定位孔在去除模制销时保持不动。