Invention Application
- Patent Title: Method of Fabricating a Sige Semiconductor Structure
- Patent Title (中): 制造精密半导体结构的方法
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Application No.: US10587661Application Date: 2004-10-24
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Publication No.: US20080213987A1Publication Date: 2008-09-04
- Inventor: Peter Deixler , Brian Wroblewski , Roy Colclaser
- Applicant: Peter Deixler , Brian Wroblewski , Roy Colclaser
- Applicant Address: NL Eindhoven
- Assignee: KONIN-KLIJKE PHILIPS ELECTRONICS, N.V.
- Current Assignee: KONIN-KLIJKE PHILIPS ELECTRONICS, N.V.
- Current Assignee Address: NL Eindhoven
- International Application: PCT/IB2004/052184 WO 20041024
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
A method of fabricating an integrated circuit includes providing a substrate and creating base-windows in a layer. The method also includes forming a monocrystalline SiGe base layer in each of the base layers, and polycrystalline SiGe elsewhere. Additionally, the method also includes forming a monocrystalline silicon layer over selectively exposed portions of the surface of the substrate. The integrated circuit beneficially includes silicon-based elements such as a lateral pnp transistor, a varactor, and a polysilicon transistor, which are formed on a common substrate with an npn SiGe bipolar transistor.
Public/Granted literature
- US3234242A Production of 4:4'-diamino-1:1'-dianthraquinonyl sulfonic acids Public/Granted day:1966-02-08
Information query
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