Method of Fabricating a Sige Semiconductor Structure
    1.
    发明申请
    Method of Fabricating a Sige Semiconductor Structure 审中-公开
    制造精密半导体结构的方法

    公开(公告)号:US20080213987A1

    公开(公告)日:2008-09-04

    申请号:US10587661

    申请日:2004-10-24

    CPC classification number: H01L29/66242 H01L21/8249 H01L29/7378

    Abstract: A method of fabricating an integrated circuit includes providing a substrate and creating base-windows in a layer. The method also includes forming a monocrystalline SiGe base layer in each of the base layers, and polycrystalline SiGe elsewhere. Additionally, the method also includes forming a monocrystalline silicon layer over selectively exposed portions of the surface of the substrate. The integrated circuit beneficially includes silicon-based elements such as a lateral pnp transistor, a varactor, and a polysilicon transistor, which are formed on a common substrate with an npn SiGe bipolar transistor.

    Abstract translation: 一种制造集成电路的方法包括提供衬底并在层中形成基底窗口。 该方法还包括在每个基层中形成单晶SiGe基层,在其它地方形成多晶SiGe。 另外,该方法还包括在衬底的表面的选择性暴露部分上形成单晶硅层。 集成电路有利地包括硅基元件,例如横向pnp晶体管,变容二极管和多晶硅晶体管,其形成在具有npn SiGe双极晶体管的公共衬底上。

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