发明申请
US20080237887A1 SEMICONDUCTOR DIE STACK HAVING HEIGHTENED CONTACT FOR WIRE BOND 审中-公开
具有电线接头的半导体电路板

  • 专利标题: SEMICONDUCTOR DIE STACK HAVING HEIGHTENED CONTACT FOR WIRE BOND
  • 专利标题(中): 具有电线接头的半导体电路板
  • 申请号: US11693651
    申请日: 2007-03-29
  • 公开(公告)号: US20080237887A1
    公开(公告)日: 2008-10-02
  • 发明人: Hem TakiarShrikar Bhagath
  • 申请人: Hem TakiarShrikar Bhagath
  • 主分类号: H01L23/52
  • IPC分类号: H01L23/52
SEMICONDUCTOR DIE STACK HAVING HEIGHTENED CONTACT FOR WIRE BOND
摘要:
A semiconductor device is disclosed including die bond pads which are heightened to allow wire bonding of offset stacked die even in tight offset configurations. After a first die is affixed to a substrate, one or more layers of an electrical conductor may be provided on some or all of the die bond pads of the first substrate to raise the height of the bond pads. The conductive layers may for example be conductive balls deposited on the die bond pads of the first substrate using a known wire bond capillary. Thereafter, a second die may be added, and wire bonding of the first die may be accomplished using a known wire bond capillary mounting a wire bond ball on a raised surface of a first semiconductor die bond pad.
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