An apparatus, system, and method are disclosed for testing data compression and data encryption circuitry. A pattern configuration module generates initial pattern parameters. Holding registers store the initial pattern parameters. A pattern generation module generates patterns for compression/encryption logic. A detection module detects a failure of the compression/encryption logic. The failure of the compression/encryption logic may be a cyclic redundancy check failure of a decompression module and/or a message authentication code failure of a decryption module.