发明申请
- 专利标题: SEMICONDUCTOR DEVICE WITH IMPROVED CONTACT FUSE
- 专利标题(中): 具有改进的触点保险丝的半导体器件
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申请号: US12172937申请日: 2008-07-14
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公开(公告)号: US20080265366A1公开(公告)日: 2008-10-30
- 发明人: Honglin Guo , Dongmei Lei , Brian Goodlin , Joe McPherson
- 申请人: Honglin Guo , Dongmei Lei , Brian Goodlin , Joe McPherson
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 主分类号: H01L23/525
- IPC分类号: H01L23/525
摘要:
One aspect of the invention provides an integrated circuit(IC) [400b]. The IC comprises transistors [410b] and contact fuses [422b]. The contact fuses each comprise a conducting layer [424b], a frustum-shaped contact [426b] has a narrower end that contacts the conducting layer and a first metal layer [427b] that is located over the conducting layer. A wider end of the frustum-shaped contact contacts the first metal layer. The frustum-shaped contact has a ratio of an opening of the wider end to the narrower end that is at least about 1.2. The contact fuses each further include a heat sink [432b] that is located over and contacts the first metal layer.
公开/授权文献
- US07612454B2 Semiconductor device with improved contact fuse 公开/授权日:2009-11-03
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