发明申请
- 专利标题: Apparatus and method of detecting errors in embedded software
- 专利标题(中): 检测嵌入式软件错误的装置和方法
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申请号: US11984105申请日: 2007-11-13
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公开(公告)号: US20080282229A1公开(公告)日: 2008-11-13
- 发明人: Han-cheol Kim , Keun-soo Yim , Seung-won Lee , Jeong-joon Yoo , Jae-don Lee , Young-sam Shin
- 申请人: Han-cheol Kim , Keun-soo Yim , Seung-won Lee , Jeong-joon Yoo , Jae-don Lee , Young-sam Shin
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2006-0120954 20061201
- 主分类号: G06F9/44
- IPC分类号: G06F9/44
摘要:
A method and apparatus for detecting errors in an application software of an embedded system are provided. The method of detecting errors in an application software includes determining a development language of the application software and an operating system on which the application software is executed; replacing an error detection syntax inserted in order to examine an error in a predetermined function of the application software, with an error detection syntax according to the result of the determination; and performing exception handling for an error occurring in the function according to the result of the replacement, and logging error information according to the exception handling. According to the method and apparatus, an error can be automatically detected and logged irrespective of a development language and an operating system.
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