发明申请
- 专利标题: METHOD OF FABRICATING AN ISOLATION SHALLOW TRENCH
- 专利标题(中): 制造隔离层的方法
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申请号: US11969913申请日: 2008-01-06
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公开(公告)号: US20080286935A1公开(公告)日: 2008-11-20
- 发明人: Jen-Jui Huang , Hsiu-Chun Lee , Chang-Ho Yeh
- 申请人: Jen-Jui Huang , Hsiu-Chun Lee , Chang-Ho Yeh
- 优先权: TW096117409 20070516
- 主分类号: H01L21/76
- IPC分类号: H01L21/76
摘要:
A method of fabricating an isolation shallow trench contains providing a substrate with at least a deep trench, forming a cap layer on the upper portion of the deep trench, forming a crust layer on a portion of the cap layer, defining a trench extending through the cap layer and the conductive layer, and forming an isolation layer in the shallow trench.
公开/授权文献
- US07569451B2 Method of fabricating an isolation shallow trench 公开/授权日:2009-08-04
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