发明申请
- 专利标题: MEMORY CELL AND METHOD FOR MANUFACTURING AND OPERATING THE SAME
- 专利标题(中): 存储单元及其制造和操作的方法
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申请号: US11753850申请日: 2007-05-25
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公开(公告)号: US20080290397A1公开(公告)日: 2008-11-27
- 发明人: Tzu-Hsuan Hsu , Ming-Hsiang Hsueh , Yen-Hao Shih , Chia-Wei Wu
- 申请人: Tzu-Hsuan Hsu , Ming-Hsiang Hsueh , Yen-Hao Shih , Chia-Wei Wu
- 申请人地址: TW Hsinchu
- 专利权人: MACRONIX International Co., Ltd.
- 当前专利权人: MACRONIX International Co., Ltd.
- 当前专利权人地址: TW Hsinchu
- 主分类号: H01L29/792
- IPC分类号: H01L29/792 ; H01L21/336
摘要:
A memory cell is disposed on a substrate having plurality of isolation structures that define at least a fin structure in the substrate, wherein the surface of the fin structure is higher than that of the isolation structures. The memory cell includes a gate, a charge trapping structure, a protection layer and two source/drain regions. The gate is disposed on the substrate,and straddled the fin structure. The charge trapping structure is disposed between the gate and the fin structure. The protection layer is disposed between the upper portion of the fin structure and the gate separating the charge trapping structure. The source/drain regions are disposed in the fin structure at both sides of the gate.
公开/授权文献
- US07795088B2 Method for manufacturing memory cell 公开/授权日:2010-09-14
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