发明申请
- 专利标题: Chip Scale Package and Method of Assembling the Same
- 专利标题(中): 芯片级封装及其组装方法
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申请号: US10581395申请日: 2004-12-02
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公开(公告)号: US20080290509A1公开(公告)日: 2008-11-27
- 发明人: Hien Boon Tan , Chuen Khiang Wang , Rahamat Bidin , Anthony Yi Sheng Sun , Desmond Yok Rue Chong , Ravi Kanth Kolan
- 申请人: Hien Boon Tan , Chuen Khiang Wang , Rahamat Bidin , Anthony Yi Sheng Sun , Desmond Yok Rue Chong , Ravi Kanth Kolan
- 申请人地址: SG Singapore
- 专利权人: UNITED TEST AND ASSEMBLY CENTER
- 当前专利权人: UNITED TEST AND ASSEMBLY CENTER
- 当前专利权人地址: SG Singapore
- 国际申请: PCT/IB2004/004394 WO 20041202
- 主分类号: H01L23/488
- IPC分类号: H01L23/488 ; H01L21/60
摘要:
A method of producing a chip scale package is disclosed. The method includes dicing a wafer into a plurality of chip arrays, each array including two or more integrated circuit chips. The method further includes mounting each array on a substrate and dicing each array, attached to the substrate, into individual chip scale packages, each individual chip scale package including only one integrated circuit chip.
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IPC分类: