发明申请
US20080310068A1 Control circuit of semiconductor device having over-heat protecting function
有权
具有过热保护功能的半导体器件的控制电路
- 专利标题: Control circuit of semiconductor device having over-heat protecting function
- 专利标题(中): 具有过热保护功能的半导体器件的控制电路
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申请号: US12155078申请日: 2008-05-29
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公开(公告)号: US20080310068A1公开(公告)日: 2008-12-18
- 发明人: Hiroo Yabe , Kazuhiro Kubota , Masato Sasahara
- 申请人: Hiroo Yabe , Kazuhiro Kubota , Masato Sasahara
- 专利权人: Yazaki Corporation
- 当前专利权人: Yazaki Corporation
- 优先权: JPP2007-155456 20070612
- 主分类号: H03K17/18
- IPC分类号: H03K17/18 ; H02H5/04
摘要:
A control circuit of a semiconductor device includes: a semiconductor element which supplies an electric power to a load; an over-heat protecting unit having: a temperature detecting section which detects a rise in temperature; a latch section which holds an output of the temperature detecting section; and a gate interrupting section which interrupts an input to a gate of the semiconductor element in accordance with the output of the latch section; a control unit which supplies a PWM signal for turning on/off the semiconductor element; a driving electric power supply unit which supplies a driving electric power for driving the over-heat protecting unit; and a timer unit which allows the driving electric power supply unit to supply the driving electric power for a predetermined period when the input to the gate of the semiconductor element is interrupted and the control unit stops to supply the PWM signal.
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