发明申请
US20080315396A1 Mold compound circuit structure for enhanced electrical and thermal performance
审中-公开
模具复合电路结构,提高电气和热性能
- 专利标题: Mold compound circuit structure for enhanced electrical and thermal performance
- 专利标题(中): 模具复合电路结构,提高电气和热性能
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申请号: US12152189申请日: 2008-05-12
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公开(公告)号: US20080315396A1公开(公告)日: 2008-12-25
- 发明人: Mark A. Kuhlman , Anil Agarwal
- 申请人: Mark A. Kuhlman , Anil Agarwal
- 申请人地址: US MA Woburn
- 专利权人: SKYWORKS SOLUTIONS, INC.
- 当前专利权人: SKYWORKS SOLUTIONS, INC.
- 当前专利权人地址: US MA Woburn
- 主分类号: H01L23/48
- IPC分类号: H01L23/48 ; H01L21/56
摘要:
According to an exemplary embodiment, an overmolded semiconductor package includes at least one semiconductor die situated over a package substrate. The overmolded semiconductor package further includes a mold compound overlying the at least one semiconductor die and the package substrate and having a top surface. The overmolded semiconductor package further includes a first patterned conductive layer situated on the top surface of the mold compound. The overmolded semiconductor package can further include at least one conductive interconnect situated in the mold compound, where the at least one conductive interconnect is electrically connected to the first patterned conductive layer. The first patterned conductive layer can include at least one passive component.
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