发明申请
- 专利标题: Semiconductor device including trench gate transistor and method of forming the same
- 专利标题(中): 包括沟槽栅晶体管的半导体器件及其形成方法
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申请号: US12219197申请日: 2008-07-17
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公开(公告)号: US20090020809A1公开(公告)日: 2009-01-22
- 发明人: Yoshihiro Kitamura , Toru Miyazaki
- 申请人: Yoshihiro Kitamura , Toru Miyazaki
- 申请人地址: JP Tokyo
- 专利权人: ELPIDA MEMORY, INC.
- 当前专利权人: ELPIDA MEMORY, INC.
- 当前专利权人地址: JP Tokyo
- 优先权: JPP2007-188084 20070719
- 主分类号: H01L29/78
- IPC分类号: H01L29/78
摘要:
A semiconductor device includes an active region having a groove, a gate insulating film, and a gate electrode. The gate electrode may include first and second layers. The first layer extends along the gate insulating film. The first layer is electrically conductive. The second layer extends along the first layer. The second layer is separate from the gate insulating film by the first layer.
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