发明申请
US20090024877A1 System and Method for Creating Different Start Cache and Bus States Using Multiple Test Patterns for Processor Design Verification and Validation
有权
使用多种测试模式创建不同的启动缓存和总线状态的系统和方法用于处理器设计验证和验证
- 专利标题: System and Method for Creating Different Start Cache and Bus States Using Multiple Test Patterns for Processor Design Verification and Validation
- 专利标题(中): 使用多种测试模式创建不同的启动缓存和总线状态的系统和方法用于处理器设计验证和验证
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申请号: US11779383申请日: 2007-07-18
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公开(公告)号: US20090024877A1公开(公告)日: 2009-01-22
- 发明人: Shubhodeep Roy Choudhury , Manoj Dusanapudi , Sunil Suresh Hatti , Shakti Kapoor , Chakrapani Rayadurgam , Batchu Naga Venkata Satyanarayana
- 申请人: Shubhodeep Roy Choudhury , Manoj Dusanapudi , Sunil Suresh Hatti , Shakti Kapoor , Chakrapani Rayadurgam , Batchu Naga Venkata Satyanarayana
- 主分类号: G06F11/26
- IPC分类号: G06F11/26
摘要:
A system and method for creating different start cache and bus states using multiple test patterns for processor design verification and validation is presented. A test pattern generator/tester re-uses test patterns in different configurations that alter cache states and translation lookaside buffer (TLB) states, which produces different timing scenarios on a broadband bus. The test pattern generator/tester creates multiple test patterns for a multi-processor system and executes the test patterns repeatedly in different configurations without rebuilding the test patterns. This enables a system to dedicate more time executing the test patterns instead of building the test patterns. By repeatedly executing the same test patterns in a different configuration, the invention described herein produces different start cache states, different TLB states, along with other processor units, each time the test patterns execute that, in turn, changes the bus timing.
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