发明申请
US20090046360A1 Raster scanning light microscope with line pattern scanning and applications
审中-公开
光栅扫描光学显微镜与线图扫描和应用
- 专利标题： Raster scanning light microscope with line pattern scanning and applications
- 专利标题（中）： 光栅扫描光学显微镜与线图扫描和应用
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申请号： US11987218申请日： 2007-11-28
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公开(公告)号： US20090046360A1公开(公告)日： 2009-02-19
- 发明人: Joerg-Michael Funk , Ralf Wolleschensky , Bernhard Zimmermann , Stefan Wilhelm , Ralf Engelmann
- 申请人： Joerg-Michael Funk , Ralf Wolleschensky , Bernhard Zimmermann , Stefan Wilhelm , Ralf Engelmann
- 优先权： DE102004034961.4 20040716
- 主分类号： G02B21/06
- IPC分类号： G02B21/06
摘要：
Raster scanning light microscope with line pattern scanning with at least one illumination module, in which the means to achieve a variable partition of the laser light into least two illumination channels are envisioned and joint illumination of a sample takes place at the same or at different areas of the sample.
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