发明申请
- 专利标题： PROBE FOR ELECTRICAL TEST AND ELECTRICAL CONNECTING APPARATUS USING IT
- 专利标题（中）： 电气测试和电气连接设备的探索
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申请号： US11817493申请日： 2005-03-07
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公开(公告)号： US20090051382A1公开(公告)日： 2009-02-26
- 发明人: Shinji Kuniyoshi , Hideki Hirakawa , Akira Soma , Takayuki Hayashizaki
- 申请人： Shinji Kuniyoshi , Hideki Hirakawa , Akira Soma , Takayuki Hayashizaki
- 申请人地址： JP Tokyo
- 专利权人： KABUSHIKI KAISHA NIHON MICRONICS
- 当前专利权人： KABUSHIKI KAISHA NIHON MICRONICS
- 当前专利权人地址： JP Tokyo
- 国际申请： PCT/JP2005/004382 WO 20050307
- 主分类号： G01R1/067
- IPC分类号： G01R1/067
摘要：
A probe includes an arm region extending in the back and forth direction, and a tip region extending downward from the front end portion of the arm region. The tip region has a pedestal portion integrally continuous to a lower edge portion at the front end side of the arm region and having an underside inclined to an imaginary axis extending in the vertical direction; and a contact portion projected from the underside of the pedestal portion and having a tip orthogonal to an imaginary axis. Thus, the position of the tip can be accurately determined.
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