发明申请
US20090061237A1 LOW k POROUS SiCOH DIELECTRIC AND INTEGRATION WITH POST FILM FORMATION TREATMENT
审中-公开
低k多孔SiCOH电介质和后期成膜处理的整合
- 专利标题: LOW k POROUS SiCOH DIELECTRIC AND INTEGRATION WITH POST FILM FORMATION TREATMENT
- 专利标题(中): 低k多孔SiCOH电介质和后期成膜处理的整合
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申请号: US11846182申请日: 2007-08-28
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公开(公告)号: US20090061237A1公开(公告)日: 2009-03-05
- 发明人: Stephen M. Gates , Alfred Grill , Son Nguyen , Satyanarayana V. Nitta , Thomas M. Shaw
- 申请人: Stephen M. Gates , Alfred Grill , Son Nguyen , Satyanarayana V. Nitta , Thomas M. Shaw
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 主分类号: B32B27/06
- IPC分类号: B32B27/06 ; C08G77/00 ; C08G77/12
摘要:
A porous SiCOH (e.g., p-SiCOH) dielectric film in which the stress change caused by increased tetrahedral strain is minimized by post treatment in unsaturated Hydrocarbon ambient. The inventive p-SiCOH dielectric film has more —(CHx) and less Si—O—H and Si—H bondings as compared to prior art p-SiCOH dielectric films. Moreover, a stable pSiOCH dielectric film is provided in which the amount of Si—OH (silanol) and Si—H groups at least within the pores has been reduced by about 90% or less by the post treatment. Hence, the inventive p-SiCOH dielectric film has hydrophobicity improvement as compared with prior art p-SiCOH dielectric films. In the present invention, a p-SiCOH dielectric film is produced that is flexible since the pores of the inventive film include stabilized crosslinking —(CHx)— chains wherein x is 1,2 or 3 therein. The dielectric film is produced utilizing an annealing step subsequent deposition that includes a gaseous ambient that includes at least one C—C double bond and/or at least one C—C triple bond.
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