Invention Application
US20090097178A1 METHODS AND APPARATUS TO DETECT AND OVER-CURRENT IN SWITCHING CIRCUITS
审中-公开
在开关电路中检测和过流的方法和装置
- Patent Title: METHODS AND APPARATUS TO DETECT AND OVER-CURRENT IN SWITCHING CIRCUITS
- Patent Title (中): 在开关电路中检测和过流的方法和装置
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Application No.: US11871691Application Date: 2007-10-12
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Publication No.: US20090097178A1Publication Date: 2009-04-16
- Inventor: Jagadeesh Krishnan , Angelo W. Pereira , Rajkumar Jayaraman , Paul H. Fontaine
- Applicant: Jagadeesh Krishnan , Angelo W. Pereira , Rajkumar Jayaraman , Paul H. Fontaine
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Main IPC: H02H3/08
- IPC: H02H3/08

Abstract:
Methods and apparatus to detect an over-current in switching circuits are described. An example method to detect an over-current in a switching circuit includes randomly selecting a sensor from a plurality of sensors operatively coupled to an output stage of the switching circuit; detecting a first voltage via the randomly selected sensor; and comparing the first voltage to a reference voltage to generate a signal, wherein the signal indicates a status of the output stage of the switching circuit.
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