发明申请
US20090098309A1 In-Situ Etching Of Shadow Masks Of A Continuous In-Line Shadow Mask Vapor Deposition System
审中-公开
连续在线阴影掩模气相沉积系统的阴影掩模的原位蚀刻
- 专利标题: In-Situ Etching Of Shadow Masks Of A Continuous In-Line Shadow Mask Vapor Deposition System
- 专利标题(中): 连续在线阴影掩模气相沉积系统的阴影掩模的原位蚀刻
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申请号: US12250150申请日: 2008-10-13
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公开(公告)号: US20090098309A1公开(公告)日: 2009-04-16
- 发明人: Thomas Peter Brody , Joseph A. Marcanio
- 申请人: Thomas Peter Brody , Joseph A. Marcanio
- 申请人地址: VG Tortola
- 专利权人: ADVANTECH GLOBAL, LTD
- 当前专利权人: ADVANTECH GLOBAL, LTD
- 当前专利权人地址: VG Tortola
- 主分类号: B05D5/12
- IPC分类号: B05D5/12
摘要:
In a method of using and cleaning one or more shadow masks of a shadow mask vapor deposition system used to form an electronic device, a substrate is advanced through series connected deposition vacuum vessels. As the substrate advances through each deposition vacuum vessel, material from a material deposition source positioned in the deposition vacuum vessel is deposited on the substrate through a shadow mask positioned therein. The material is also deposited on a surface of the shadow mask that faces the one material deposition source. Following the deposit of material on the surface of the shadow mask in at least one deposition vacuum vessel, a reactive gas is introduced into the deposition vacuum vessel absent the substrate therein. The reactive gas is then ionized to remove the material deposited on the shadow mask.
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