发明申请
- 专利标题： EDDY CURRENT PROBE AND METHODS OF ASSEMBLING THE SAME
- 专利标题（中）： EDDY电流探头及其组装方法
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申请号： US11935118申请日： 2007-11-05
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公开(公告)号： US20090115410A1公开(公告)日： 2009-05-07
- 发明人: William Stewart McKnight , Ui Suh , Yuri Plotnikov , Changting Wang , Ralph Gerald Isaacs
- 申请人： William Stewart McKnight , Ui Suh , Yuri Plotnikov , Changting Wang , Ralph Gerald Isaacs
- 主分类号： G01N27/90
- IPC分类号： G01N27/90 ; H01F41/00
摘要：
A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.
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