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    FLEXIBLE EDDY CURRENT ARRAY PROBE AND METHODS OF ASSEMBLING THE SAME
    3.
    发明申请
    FLEXIBLE EDDY CURRENT ARRAY PROBE AND METHODS OF ASSEMBLING THE SAME 失效
    柔性EDDY电流阵列探针及其组装方法

    公开(公告)号：US20090115411A1

    公开(公告)日：2009-05-07

    申请号：US11935077

    申请日：2007-11-05

    申请人： Haiyan Sun ,  Yuri Plotnikov ,  Changting Wang ,  William Stewart McKnight ,  Ui Suh

    发明人： Haiyan Sun ,  Yuri Plotnikov ,  Changting Wang ,  William Stewart McKnight ,  Ui Suh

    IPC分类号： G01N27/90 ,  H01F41/00

    CPC分类号： G01N27/9033 ,  Y10T29/4902

    摘要： A method of assembling an eddy current probe for use in nondestructive testing of a sample is described. The method includes positioning at least one substantially planar spiral drive coil within the eddy current probe, such that the drive coil is at least one of adjacent to and at least partially within a flexible material. The method further includes coupling at least one unpackaged solid-state magnetic field sensor to the at least one drive coil.

    摘要翻译： 描述了组装用于样品的非破坏性测试的涡流探针的方法。 该方法包括将至少一个基本上平面的螺旋驱动线圈定位在涡流探针内，使得驱动线圈是与柔性材料相邻并且至少部分地在柔性材料内的至少一个。 该方法还包括将至少一个未封装的固态磁场传感器耦合到至少一个驱动线圈。

    Flexible eddy current array probe and methods of assembling the same
    4.
    发明授权
    Flexible eddy current array probe and methods of assembling the same 失效
    灵活的涡流阵列探头及其组装方法

    公开(公告)号：US07952348B2

    公开(公告)日：2011-05-31

    申请号：US11935077

    申请日：2007-11-05

    申请人： Haiyan Sun ,  Yuri Plotnikov ,  Changting Wang ,  William Stewart McKnight ,  Ui Suh

    发明人： Haiyan Sun ,  Yuri Plotnikov ,  Changting Wang ,  William Stewart McKnight ,  Ui Suh

    IPC分类号： G01N27/82 ,  G01R33/12

    CPC分类号： G01N27/9033 ,  Y10T29/4902

    摘要： A method of assembling an eddy current probe for use in nondestructive testing of a sample is described. The method includes positioning at least one substantially planar spiral drive coil within the eddy current probe, such that the drive coil is at least one of adjacent to and at least partially within a flexible material. The method further includes coupling at least one unpackaged solid-state magnetic field sensor to the at least one drive coil.

    摘要翻译： 描述了组装用于样品的非破坏性测试的涡流探针的方法。 该方法包括将至少一个基本上平面的螺旋驱动线圈定位在涡流探针内，使得驱动线圈是与柔性材料相邻并且至少部分地在柔性材料内的至少一个。 该方法还包括将至少一个未封装的固态磁场传感器耦合到至少一个驱动线圈。

    Inspection method and system using multifrequency phase analysis
    6.
    发明授权
    Inspection method and system using multifrequency phase analysis 有权
    检验方法和系统采用多频相分析

    公开(公告)号：US07206706B2

    公开(公告)日：2007-04-17

    申请号：US11210119

    申请日：2005-08-22

    申请人： Changting Wang ,  William Stewart McKnight ,  Ui Suh ,  Serkan Ertekin

    发明人： Changting Wang ,  William Stewart McKnight ,  Ui Suh ,  Serkan Ertekin

    IPC分类号： G06F19/00

    CPC分类号： G01N27/9046 ,  G01N27/9086

    摘要： A method for inspecting a part is provided. The method includes applying a number of multifrequency excitation signals to a probe to generate a number of multifrequency response signals for the part being inspected. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect a subsurface of the part. An inspection system is provided and includes an eddy current (EC) probe configured to induce eddy currents in a part. The system further includes an eddy current instrument coupled to the EC probe and configured to apply multifrequency excitation signals to the EC probe to generate multifrequency response signals. The system further includes a processor configured to analyze the multifrequency response signals from the EC instrument by performing a multifrequency phase analysis, to inspect a subsurface of the part.

    摘要翻译： 提供了一种用于检查零件的方法。 该方法包括将多个多频激励信号应用于探针，以产生被检测部分的多个多频响应信号。 该方法还包括对多频响应信号执行多频相分析以检查该部分的地下。 提供了一种检查系统，并且包括涡流（EC）探针，其配置成在部件中感应涡流。 该系统还包括耦合到EC探头并被配置为向EC探头施加多频激励信号以产生多频响应信号的涡流仪器。 该系统还包括处理器，其被配置为通过执行多频相分析来分析来自EC仪器的多频响应信号，以检查该部件的地下。

    Eddy current probe and inspection method
    8.
    发明申请
    Eddy current probe and inspection method 失效
    涡流探头和检查方法

    公开(公告)号：US20060132124A1

    公开(公告)日：2006-06-22

    申请号：US11019343

    申请日：2004-12-21

    申请人： Mottito Togo ,  Changting Wang ,  Yuri Plotnikov ,  Shyamsunder Mandayam ,  William McKnight ,  Walter Bantz ,  Ui Suh

    发明人： Mottito Togo ,  Changting Wang ,  Yuri Plotnikov ,  Shyamsunder Mandayam ,  William McKnight ,  Walter Bantz ,  Ui Suh

    IPC分类号： G01N27/82

    CPC分类号： G01N27/904 ,  G01N27/902

    摘要： An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.

    摘要翻译： 提供用于检查元件的涡流（EC）探头。 EC探针包括切向驱动线圈，该切线驱动线圈被配置为产生用于在部件中感应涡流的探测场，其中涡流的一部分平行于部件的边缘排列。 切向驱动线圈的轴线平行于部件的表面对准。 EC探针还包括一对感测线圈，其中感测线圈的轴线垂直于部件的表面对准。 感测线圈被配置为感测平行于部件的边缘排列的涡流的部分。

    Inspection of non-planar parts using multifrequency eddy current with phase analysis
    9.
    发明授权
    Inspection of non-planar parts using multifrequency eddy current with phase analysis 失效
    使用相位分析的多频涡流检查非平面部件

    公开(公告)号：US07518359B2

    公开(公告)日：2009-04-14

    申请号：US11331394

    申请日：2006-01-12

    申请人： Changting Wang ,  Ui Suh

    发明人： Changting Wang ,  Ui Suh

    IPC分类号： G01N27/82

    CPC分类号： G01N27/9046 ,  G01N27/9086

    摘要： A non-planar part has a non-planar surface such as an edge, and may contain an anomaly such as a crack. The non-planar part is inspected using an eddy current technique. The method includes providing the non-planar part having the non-planar surface thereon, driving an eddy current probe at two or more frequencies, measuring an eddy current response signal of the non-planar part at each frequency, and performing a multifrequency phase analysis on the eddy current response signals.

    摘要翻译： 非平面部分具有诸如边缘的非平面表面，并且可能包含诸如裂纹的异常。 使用涡流技术检查非平面部分。 该方法包括在其上提供具有非平面表面的非平面部分，以两个或更多个频率驱动涡流探针，测量每个频率处非平面部分的涡流响应信号，并执行多频相分析 对涡流响应信号。

    Inspection method and system using multifrequency phase analysis
    10.
    发明申请
    Inspection method and system using multifrequency phase analysis 有权
    检验方法和系统采用多频相分析

    公开(公告)号：US20060217908A1

    公开(公告)日：2006-09-28

    申请号：US11210119

    申请日：2005-08-22

    申请人： Changting Wang ,  William Mcknight ,  Ui Suh ,  Serkan Ertekin

    发明人： Changting Wang ,  William Mcknight ,  Ui Suh ,  Serkan Ertekin

    IPC分类号： G01R19/00

    CPC分类号： G01N27/9046 ,  G01N27/9086

    摘要： A method for inspecting a part is provided. The method includes applying a number of multifrequency excitation signals to a probe to generate a number of multifrequency response signals for the part being inspected. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect a subsurface of the part. An inspection system is provided and includes an eddy current (EC) probe configured to induce eddy currents in a part. The system further includes an eddy current instrument coupled to the EC probe and configured to apply multifrequency excitation signals to the EC probe to generate multifrequency response signals. The system further includes a processor configured to analyze the multifrequency response signals from the EC instrument by performing a multifrequency phase analysis, to inspect a subsurface of the part.

    摘要翻译： 提供了一种用于检查零件的方法。 该方法包括将多个多频激励信号应用于探针，以产生被检测部分的多个多频响应信号。 该方法还包括对多频响应信号执行多频相分析以检查该部分的地下。 提供了一种检查系统，并且包括涡流（EC）探针，其配置成在部件中感应涡流。 该系统还包括耦合到EC探头并被配置为向EC探头施加多频激励信号以产生多频响应信号的涡流仪器。 该系统还包括处理器，其被配置为通过执行多频相分析来分析来自EC仪器的多频响应信号，以检查该部分的地下。