Invention Application
- Patent Title: MINIATURIZED SYSTEM AND METHOD FOR MEASURING OPTICAL CHARACTERISTICS
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Application No.: US12343366Application Date: 2008-12-23
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Publication No.: US20090147243A1Publication Date: 2009-06-11
- Inventor: Wayne D. Jung , Russell W. Jung , Walter W. Sloan , Alan R. Loudermilk
- Applicant: Wayne D. Jung , Russell W. Jung , Walter W. Sloan , Alan R. Loudermilk
- Assignee: VITA ZAHNFABRIK H. RAUTER GMBH & CO. KG
- Current Assignee: VITA ZAHNFABRIK H. RAUTER GMBH & CO. KG
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01J3/28 ; G01N21/25 ; G01D18/00

Abstract:
A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems.
Public/Granted literature
- US07978317B2 Miniaturized system and method for measuring optical characteristics Public/Granted day:2011-07-12
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