发明申请
- 专利标题: CRITICAL PATH SELECTION FOR AT-SPEED TEST
- 专利标题(中): 用于速度测试的关键路径选择
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申请号: US11954138申请日: 2007-12-11
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公开(公告)号: US20090150844A1公开(公告)日: 2009-06-11
- 发明人: Vikram Iyengar , David E. Lackey , Subbayyan Venkatesan , Chandramouli Visweswariah , Jinjun Xiong
- 申请人: Vikram Iyengar , David E. Lackey , Subbayyan Venkatesan , Chandramouli Visweswariah , Jinjun Xiong
- 申请人地址: US NY ARMONK
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY ARMONK
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
A method of critical path selection provides a set of paths that initially contains no paths. A timing tool is used to identify potential critical paths of an integrated circuit design. Each potential critical path is evaluated and the potential critical path is added to the set of paths if logic devices within the potential critical path are shared by less than a predetermined number of critical paths within the set of paths. This evaluating and adding process is repeated for each of the potential critical paths until all of the potential critical paths have been evaluated. Then, the potential critical paths within the set of paths can be output.