发明申请
- 专利标题: SEMICONDUCTOR DEVICE HEAT DISSIPATION STRUCTURE
- 专利标题(中): 半导体器件散热结构
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申请号: US11960030申请日: 2007-12-19
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公开(公告)号: US20090160013A1公开(公告)日: 2009-06-25
- 发明人: Michel J. Abou-Khalil , Robert J. Gauthier, JR. , Tom C. Lee , Junjun Li , Souvick Mitra , Christopher S. Putnam
- 申请人: Michel J. Abou-Khalil , Robert J. Gauthier, JR. , Tom C. Lee , Junjun Li , Souvick Mitra , Christopher S. Putnam
- 主分类号: H01L29/00
- IPC分类号: H01L29/00 ; H01L21/4763
摘要:
A heat generating component of a semiconductor device is located between two heavily doped semiconductor regions in a semiconductor substrate. The heat generating component may be a middle portion of a diode having a light doping, a lightly doped p-n junction between a cathode and anode of a silicon controlled rectifier, or a resistive portion of a doped semiconductor resistor. At least one thermally conductive via comprising a metal or a non-metallic conductive material is place directly on the heat generating component. Alternatively, a thin dielectric layer may be formed between the heat generating component and the at least one thermally conductive via. The at least one thermally conductive via may, or may not, be connected to a back-end-of-line metal wire, which may be connected to higher level of metal wiring or to a handle substrate through a buried insulator layer.
公开/授权文献
- US08421128B2 Semiconductor device heat dissipation structure 公开/授权日:2013-04-16
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