Invention Application
US20090173887A1 CHARGED PARTICLE BEAM TRAJECTORY CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS
有权
充电颗粒光束光栅修正器和充电颗粒光束装置
- Patent Title: CHARGED PARTICLE BEAM TRAJECTORY CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS
- Patent Title (中): 充电颗粒光束光栅修正器和充电颗粒光束装置
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Application No.: US12349708Application Date: 2009-01-07
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Publication No.: US20090173887A1Publication Date: 2009-07-09
- Inventor: Hiroyuki ITO , Yuko Sasaki , Ryoichi Ishii , Takashi Doi
- Applicant: Hiroyuki ITO , Yuko Sasaki , Ryoichi Ishii , Takashi Doi
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Priority: JP2008-002489 20080109
- Main IPC: H01J3/20
- IPC: H01J3/20

Abstract:
The invention relates to a trajectory correction method for a charged particle beam, and provides a low-cost, high accuracy and high-resolution converging optical system for use with a charged particle beam to solve problems with conventional aberration correction systems. To this end, the present invention uses a configuration which forms electromagnetic field which is concentrated towards a center of a beam trajectory axis, causes oblique of the beam to make use of lens effects and bend the trajectory, and consequently, cancels out large external side non-linear effects such a spherical aberration of the electron lens. Specifically, the configuration generates an electric field concentration in a simple manner by providing electrodes above the axis and applying voltages to the electrodes. Further, the above configuration can be realized trough operations using lenses and deflectors with incident axes and image formation positions that are normal.
Public/Granted literature
- US07875858B2 Charged particle beam trajectory corrector and charged particle beam apparatus Public/Granted day:2011-01-25
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