发明申请
- 专利标题: NOISE-REDUCTION METHOD FOR PROCESSING A TEST PORT
- 专利标题(中): 用于处理测试端口的噪声减少方法
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申请号: US12135451申请日: 2008-06-09
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公开(公告)号: US20090179653A1公开(公告)日: 2009-07-16
- 发明人: I-Chen CHEN , Chien-Jung Lin , Chien-Hsun Ho
- 申请人: I-Chen CHEN , Chien-Jung Lin , Chien-Hsun Ho
- 优先权: CN200810001109.1 20080115
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
摘要:
A noise-reduction method for processing a port is applied to a test target for testing or being burned in with software. At least one zero-Ohm resistor is provided with a first end thereof electrically connected to a device under test (DUT) of the test target and a second end thereof connected to a test port. Moreover, at least one grounding zero-Ohm resistor is provided with one end connected to ground and the other end is a floating end. After the test target is finished debugging or burned in with software, the connection of the first end and the DUT is disabled, and the second end is connected to ground through the floating end to reduce noise generation and improve a flexibility in circuit layout.
公开/授权文献
- US07969158B2 Noise-reduction method for processing a test port 公开/授权日:2011-06-28
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