发明申请
- 专利标题: VISUAL INSPECTION METHOD AND VISUAL INSPECTION APPARATUS
- 专利标题(中): 视觉检测方法和视觉检测装置
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申请号: US12424105申请日: 2009-04-15
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公开(公告)号: US20090202141A1公开(公告)日: 2009-08-13
- 发明人: Yoshihiro SASAKI , Masahiko Nagao
- 申请人: Yoshihiro SASAKI , Masahiko Nagao
- 申请人地址: JP Kanagawa
- 专利权人: NEC ELECTRONICS CORPORATION
- 当前专利权人: NEC ELECTRONICS CORPORATION
- 当前专利权人地址: JP Kanagawa
- 优先权: JP2001-037497 20010214
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
In a visual inspection method and apparatus, a picture processing unit converts an original picture, obtained by taking a photograph of a BGA illuminated by a ring illuminator from above, by using a camera, and labels a binary picture obtained by this binary conversion. Then, it forms a circumscribing rectangle circumscribing an outer circumference of a labeling picture obtained by the labeling, and inverts a labeling picture within the formed rectangle, and removes a portion of a region formed by the outer circumference and the circumscribing rectangle in a picture obtained by the inversion, and then generates an inspection picture by adding a picture obtained by the removal to the labeling picture, and accordingly judges a pass or rejection of the inspection target sample based on the generated inspection picture. Thus, the inspection can be carried out at a high accuracy irrespectively of a low cost.
公开/授权文献
- US07664306B2 Visual inspection method and visual inspection apparatus 公开/授权日:2010-02-16
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