Invention Application
- Patent Title: Absolute distance measurement method and system using optical frequency generator
- Patent Title (中): 绝对距离测量方法和使用光频发生器的系统
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Application No.: US12289119Application Date: 2008-10-21
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Publication No.: US20090207418A1Publication Date: 2009-08-20
- Inventor: Seung Woo Kim , Jonghan Jin , Young Jin Kim
- Applicant: Seung Woo Kim , Jonghan Jin , Young Jin Kim
- Applicant Address: KR Daejon
- Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee Address: KR Daejon
- Priority: KR10-2008-0014984 20080219
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
The present invention relates to absolute distance measurement method and system using an optical frequency generator. The absolute distance measurement method using the optical frequency generator includes (a) generating a plurality of different stabilized wavelengths by using the optical frequency generator; (b) obtaining an initial estimation value of a distance to be measured by using a frequency sweeping interferometer; (c) analyzing an uncertainty range of the obtained initial estimation value; (d) measuring excess fraction parts of the different wavelengths by analyzing interference signals for each of the wavelengths; (e) determining integer parts for each of the different wavelengths within the uncertainty range of the initial estimation value; and (f) measuring an absolute distance to be measured by using the excess fraction part and the integer parts for each of the different wavelengths.
Public/Granted literature
- US07898669B2 Absolute distance measurement method and system using optical frequency generator Public/Granted day:2011-03-01
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