发明申请
- 专利标题: VARIABLE RESISTANCE MEMORY DEVICE AND SYSTEM
- 专利标题(中): 可变电阻存储器件和系统
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申请号: US12417679申请日: 2009-04-03
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公开(公告)号: US20090251954A1公开(公告)日: 2009-10-08
- 发明人: Qi WANG , Kwang-Jin LEE , Woo-Yeong CHO , Taek-Sung KIM , Kwang-Ho KIM , Hyun-Ho CHOI
- 申请人: Qi WANG , Kwang-Jin LEE , Woo-Yeong CHO , Taek-Sung KIM , Kwang-Ho KIM , Hyun-Ho CHOI
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR2008-0032768 20080408
- 主分类号: G11C11/00
- IPC分类号: G11C11/00 ; G11C8/00 ; G11C11/416
摘要:
Disclosed is a semiconductor memory device including a memory cell array having a plurality of variable resistance memory cells divided into first and second areas. An I/O circuit is configured to access the memory cell array under the control of control logic so as to access the first or second area in response to an external command. The I/O circuit accesses the first area using a memory cell unit and the second area using a page unit.
公开/授权文献
- US07952956B2 Variable resistance memory device and system 公开/授权日:2011-05-31
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