发明申请
US20090273022A1 CONDUCTIVE HARD MASK TO PROTECT PATTERNED FEATURES DURING TRENCH ETCH
审中-公开
导电硬掩模,以保护在TRENCH ETCH期间的图案特征
- 专利标题: CONDUCTIVE HARD MASK TO PROTECT PATTERNED FEATURES DURING TRENCH ETCH
- 专利标题(中): 导电硬掩模,以保护在TRENCH ETCH期间的图案特征
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申请号: US12502796申请日: 2009-07-14
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公开(公告)号: US20090273022A1公开(公告)日: 2009-11-05
- 发明人: Steven J. Radigan , Usha Raghuram , Samuel V. Dunton , Michael W. Konevecki
- 申请人: Steven J. Radigan , Usha Raghuram , Samuel V. Dunton , Michael W. Konevecki
- 申请人地址: US CA Milpitas
- 专利权人: SanDisk 3D LLC
- 当前专利权人: SanDisk 3D LLC
- 当前专利权人地址: US CA Milpitas
- 主分类号: H01L27/105
- IPC分类号: H01L27/105 ; H01L21/8234 ; H01L21/822 ; H01L27/06
摘要:
A monolithic three dimensional memory array is formed by a method that includes forming a first memory level above a substrate by i) forming a plurality of first substantially parallel conductors extending in a first direction, ii) forming first pillars above the first conductors, each first pillar comprising a first conductive layer or layerstack above a vertically oriented diode, the first pillars formed in a single photolithography step, iii) depositing a first dielectric layer above the first pillars, and iv) etching a plurality of substantially parallel first trenches in the first dielectric layer, the first trenches extending in a second direction, wherein, after the etching step, the lowest point in the trenches is above the lowest point of the first conductive layer or layerstack, wherein the first conductive layer or layerstack does not comprise a resistivity-switching metal oxide or nitride. The method also includes monolithically forming a second memory level above the first memory level. Other aspects are also described.
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