发明申请
US20090303493A1 INTERFEROMETRY FOR LATERAL METROLOGY 有权
横向计量学的干涉

INTERFEROMETRY FOR LATERAL METROLOGY
摘要:
A method is disclosed which includes: using a scanning interferometry system, generating a sequence of phase-shifted interferometry images at different scan positions of an object comprising a buried surface, identifying a scan position corresponding to a position of best focus for the buried surface based on the sequence of phase-shifted interferometry images of the object, and generating a final image based on the phase-shifted interferometry images and the scan position, where the interferometric fringes in the final image are reduced relative to the interferometric fringes in the phase-shifted interferometry images.
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