发明申请
US20100012818A1 OPTICAL CHARACTERISTIC MAPPING INSTRUMENT 有权
光学特征映射仪

OPTICAL CHARACTERISTIC MAPPING INSTRUMENT
摘要:
A system for measuring the wavefront characteristics of a powerful laser close to an emitting or transmitting surface of the laser. The system includes a beam sampler that has a sampling aperture for sampling radiation from a sampled area along the emitting or transmitting surface. The beam sampler includes a reflector for directing un-sampled radiation onto an absorber, which absorbs un-sampled radiation. Radiation sampled by the beam sampler is sensed using a sensor.
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