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公开(公告)号：US08253087B2
公开(公告)日：2012-08-28
申请号：US12439092
申请日：2007-08-29
CPC分类号： G01J9/00 , G01J1/4257
摘要： A system for measuring the wavefront characteristics of a powerful laser close to an emitting or transmitting surface of the laser. The system includes a beam sampler that has a sampling aperture for sampling radiation from a sampled area along the emitting or transmitting surface. The beam sampler includes a reflector for directing un-sampled radiation onto an absorber, which absorbs un-sampled radiation. Radiation sampled by the beam sampler is sensed using a sensor.
摘要翻译： 一种用于测量靠近激光发射或发射表面的强大的激光器的波前特征的系统。 该系统包括具有采样孔径的光束取样器，用于沿着发射或发射表面对来自采样区域的辐射进行采样。 光束采样器包括用于将未采样的辐射引导到吸收器的反射器，吸收器吸收未采样的辐射。 使用传感器检测由采样器采样的辐射。
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公开(公告)号：US20100012818A1
公开(公告)日：2010-01-21
申请号：US12439092
申请日：2006-08-29
CPC分类号： G01J9/00 , G01J1/4257
摘要： A system for measuring the wavefront characteristics of a powerful laser close to an emitting or transmitting surface of the laser. The system includes a beam sampler that has a sampling aperture for sampling radiation from a sampled area along the emitting or transmitting surface. The beam sampler includes a reflector for directing un-sampled radiation onto an absorber, which absorbs un-sampled radiation. Radiation sampled by the beam sampler is sensed using a sensor.
摘要翻译： 一种用于测量靠近激光发射或发射表面的强大的激光器的波前特征的系统。 该系统包括具有采样孔径的光束取样器，用于沿着发射或发射表面对来自采样区域的辐射进行采样。 光束采样器包括用于将未采样的辐射引导到吸收器的反射器，吸收器吸收未采样的辐射。 使用传感器检测由采样器采样的辐射。
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